US Patent Issued to HAMAMATSU PHOTONICS on June 23 for "Sample observation device and sample observation method" (Japanese Inventor)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,375, issued on June 23, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan).

"Sample observation device and sample observation method" was invented by Satoshi Yamamoto (Hamamatsu, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "In a sample observation device, an image capturing unit includes an area image sensor that performs image capturing by the rolling shutter method in which a start of an exposure period of pixel columns in the pixel region is shifted by predetermined time, and a control unit controls the image capturing unit so that an exposure order in each of the pixel columns is reversed between a period in which a scanning uni...