US Patent Issued to HAMAMATSU PHOTONICS on Aug. 11 for "Scanning microscope unit, scanning microscope, and calibration method for scanning microscope unit" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,703, issued on Aug. 11, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan).

"Scanning microscope unit, scanning microscope, and calibration method for scanning microscope unit" was invented by Takashi Mihoya (Hamamatsu, Japan), Yasuyuki Tanabe (Hamamatsu, Japan) and Shunsuke Matsuda (Hamamatsu, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A scanning microscope unit includes: a light source for outputting irradiation light; a photodetector; a MEMS mirror for scanning an irradiation light over an observation object, and for guiding an observation light toward the photodetector; a scanning lens for guiding the irradiation light scanned...