US Patent Issued to Haag-Streit on Feb. 24 for "Device and method for measuring at least one geometric parameter of the eye" (Swiss Inventors)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,557,985, issued on Feb. 24, was assigned to Haag-Streit AG (Koniz, Switzerland).

"Device and method for measuring at least one geometric parameter of the eye" was invented by Claudio Dellagiacoma (Bern, Switzerland) and Frank Zumkehr (Zollikofen, Switzerland).

According to the abstract* released by the U.S. Patent & Trademark Office: "In order to measure at least one geometric parameter of an eye, Purkinje reflections from blue and infrared light sources are recorded with a microscope and a camera. Due to the dispersion of the optics of the microscope, at least one set of reflections is defocused. By measuring the radii of the reflections, the offset of the camera from an ideal focus...