US Patent Issued to GM GLOBAL TECHNOLOGY OPERATIONS on Sept. 8 for "Map quality assessment system" (Michigan, Texas, Washington Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,729,979, issued on Sept. 8, was assigned to GM GLOBAL TECHNOLOGY OPERATIONS LLC (Detroit).

"Map quality assessment system" was invented by Gui Chen (Sterling Heights, Mich.), Fan Bai (Ann Arbor, Mich.), Mason David Gemar (Cedar Park, Texas), Joon Hwang (Pflugerville, Texas), Shu Chen (Rochester Hills, Mich.), Ibrahim Onifade (Katy, Texas), Leila Ghorban Zadeh (Seattle) and Christian Haller (Austin, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "A map quality assessment system that evaluates error associated with primary map data includes one or more central computers that execute instructions to determine the error associated with the primary map ...