ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,654, issued on April 21, was assigned to GM Global Technology Operations LLC (Detroit).

"System and method for in-situ mapping on electrode potential and thermal distribution" was invented by Jing Gao (Rochester, Mich.), Brian J. Koch (Berkley, Mich.), Taylor R. Garrick (Bloomfield Hills, Mich.) and Wei Zeng (Oakland Township, Mich.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system for in-situ mapping of electrode potential and thermal distribution is provided. The system includes a test device. The test device includes an anode, a cathode, a reference electrode, a separator disposed between the anode and the cathode, and a voltage potential ...