ALEXANDRIA, Va., March 31 -- United States Patent no. 12,588,817, issued on March 31, was assigned to GE PRECISION HEALTHCARE LLC (Milwaukee).
"Systems and methods for generating diagnostic scan parameters from calibration images" was invented by Andre De Almeida Maximo (Rio de Janeiro, Brazil), Dattesh Dayanand Shanbhag (Bangalore, India), Chitresh Bhushan (Schenectady, N.Y.) and Dawei Gui (Sussex, Wis.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods and systems are provided for determining diagnostic-scan parameters for a magnetic resonance (MR) diagnostic-scan, from MR calibration images, enabling acquisition of high-resolution diagnostic images of one or more anatomical regions of interest, while ...