ALEXANDRIA, Va., July 15 -- United States Patent no. 12,664,768, issued on June 23, was assigned to GE Precision Healthcare LLC (Waukesha, Wis.).
"Failure mode analysis using natural language descriptors" was invented by Rahul Venkataramani (Bangalore, India).
According to the abstract* released by the U.S. Patent & Trademark Office: "In one embodiment, a method is provided for determining one or more failure modes of a machine learning model. In accordance with certain such embodiments, one or more images are accessed or acquired from a first source. The one or more images are processed using a machine learning model. The machine learning model outputs one or more processed images. One or more failure cases of the machine learning model ...