ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,195, issued on May 12, was assigned to GE Aviation Systems LLC (Grand Rapids, Ohio).
"Multi-functional integrated testing system" was invented by Xuan Yi (Niskayuna, N.Y.), Cong Li (Clifton Park, N.Y.), Han Xiong (Niskayuna, N.Y.), Yihe Hua (Clifton Park, N.Y.) and Karim Younsi (Ballston Lake, N.Y.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A test system to conduct a sequence of electrical tests of an electrical cable is disclosed. The system includes a testing unit, a set of sensors, and two circuits. The two circuits are switchably coupled to a common voltage source and selectively electrically coupleable to the electric cable to enable the tes...