US Patent Issued to FUJIFILM on Oct. 27 for "Manufacturing line abnormality portent detection apparatus, manufacturing line abnormality portent detection method, manufacturing line abnormality portent detection program, manufacturing apparatus, and inspection apparatus" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,269, issued on Oct. 27, was assigned to FUJIFILM Corp. (Tokyo).

"Manufacturing line abnormality portent detection apparatus, manufacturing line abnormality portent detection method, manufacturing line abnormality portent detection program, manufacturing apparatus, and inspection apparatus" was invented by Haruka Ikeda (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A processor of a manufacturing line abnormality portent detection apparatus acquires an image obtained by imaging a product manufactured by a manufacturing line using a radiography apparatus for each product, and acquires significant point information related to a significant point ...