US Patent Issued to FUJIFILM on May 5 for "Infrared thermal image analysis device, infrared thermal image analysis method, and program" (Japanese Inventor)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,789, issued on May 5, was assigned to FUJIFILM Corp. (Tokyo).

"Infrared thermal image analysis device, infrared thermal image analysis method, and program" was invented by Kimito Katsuyama (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are an infrared image analysis device, an infrared image analysis method, and a program capable of correctly reducing a temperature gradient. An infrared thermal image analysis device (10) includes a processor. The processor acquires a first infrared thermal image of a structure surface, which is obtained by capturing a structure (36) to be inspected, acquires region information (105) that distinguishes ...