US Patent Issued to FUJIFILM on June 23 for "Measurement system, measurement method, and measurement program" (Japanese Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,661,016, issued on June 23, was assigned to FUJIFILM Corp. (Tokyo).

"Measurement system, measurement method, and measurement program" was invented by Yasuhisa Kaneko (Kanagawa, Japan), Tomohide Hiragami (Kanagawa, Japan), Kenji Nagamiya (Kanagawa, Japan), Nobuya Kitamura (Kanagawa, Japan) and Yasuyuki Hosono (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement system comprising: a first measurement apparatus including at least a first processor; and a second measurement apparatus including at least a second processor, wherein the first processor and the second processor are configured to measure biological information of a user ...