US Patent Issued to FUJIFILM on Aug. 25 for "Inspection method, method for producing composition, and method for verifying composition" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,717,245, issued on Aug. 25, was assigned to FUJIFILM Corp. (Tokyo).

"Inspection method, method for producing composition, and method for verifying composition" was invented by Shinichi Sugiyama (Haibara-gun, Japan) and Takashi Nakamura (Haibara-gun, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is an inspection method for simply measuring an ultra-small foreign substance in a composition selected from the group consisting of an actinic ray-sensitive or radiation-sensitive composition and a thermosetting composition. In addition, provided are a method for producing a composition and a method for verifying a composition, using the inspecti...