ALEXANDRIA, Va., April 7 -- United States Patent no. 12,594,045, issued on April 7, was assigned to FUJIFILM Corp. (Tokyo).
"Calibration jig, mammography apparatus, and program" was invented by Shinichiro Konno (Kanagawa, Japan) and Takashi Tajima (Kanagawa, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A calibration jig is attached to a biopsy apparatus used in combination with a mammography apparatus, and that is for performing calibration to match three-dimensional coordinate systems of the mammography apparatus and the biopsy apparatus, and the calibration jig includes a pseudo biopsy needle that is a pseudo needle of a biopsy needle that is actually used in the biopsy apparatus; and a marker that...