ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,024, issued on Oct. 27, was assigned to FUJIFILM Business Innovation Corp. (Tokyo).
"Image inspection system that identifies defective regions" was invented by Shogo Ishikawa (Kanagawa, Japan), Takashi Kikumoto (Kanagawa, Japan) and Yoshie Ohira (Kanagawa, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An image processing apparatus includes a processor configured to: compare reference image data serving as a reference for inspection with inspection-target image data expressing an inspection target and identify a coordinate region including a difference between the reference image data and the inspection-target image data as a defective region;...