ALEXANDRIA, Va., March 17 -- United States Patent no. 12,578,907, issued on March 17, was assigned to FUJIFILM BUSINESS INNOVATION CORP. (Tokyo).

"Printed material inspection system, printed material inspection method, and non-transitory computer readable medium" was invented by Shogo Ishikawa (Yokohama, Japan), Yoshie Ohira (Yokohama, Japan) and Takashi Kikumoto (Yokohama, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A printed material inspection system includes a processor configured to inspect a quality of a printed material; and a display that displays a result of the inspection. The processor is configured to: by reading and executing a program, compare a scanned image obtained by scanning an in...