US Patent Issued to Fractilia on Nov. 3 for "System and method for determining and/or predicting unbiased parameters associated with semiconductor measurements" (Texas Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,032, issued on Nov. 3, was assigned to Fractilia LLC (Austin, Texas).

"System and method for determining and/or predicting unbiased parameters associated with semiconductor measurements" was invented by Chris Mack (Austin, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "In one embodiment, a method includes determining, by a processor, a measurement of edge detection noise; receiving a measurement of a biased parameter including measurement noise; based on the measurement of edge detection noise and a number of measurement points, determining a contribution of edge detection noise to the biased parameter; determining an unbiased parameter by subt...