US Patent Issued to FOXSEMICON INTEGRATED TECHNOLOGY on Aug. 4 for "System for storing wafer and system for monitoring pollution of wafer" (Taiwanese Inventors)

ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,701,954, issued on Aug. 4, was assigned to FOXSEMICON INTEGRATED TECHNOLOGY INC. (Miao-Li Hsien, Taiwan).

"System for storing wafer and system for monitoring pollution of wafer" was invented by Chun-Chung Chen (Miaoli Hsien, Taiwan), Yu-Wei Wu (New Taipei, Taiwan), Chun-Kai Huang (Miaoli Hsien, Taiwan) and Tang-Yu Chang (Miaoli Hsien, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system for storing wafer is provided. The system includes a wafer box, an installing member, a detection tube, a control unit, and a detection unit. The wafer box includes an outlet connector and an inlet connector extending a wall of the wafer box. The installing memb...