US Patent Issued to FORSCHUNGSZENTRUM JULICH on Sept. 8 for "Magnetization device for an electron microscope and method" (German Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,756, issued on Sept. 8, was assigned to FORSCHUNGSZENTRUM JULICH GMBH (Julich, Germany).

"Magnetization device for an electron microscope and method" was invented by Amir Hossein Tavabi (Julich, Germany), Helmut Soltner (Inden, Germany), Michael Schaaf (Herzogenrath, Germany), Maximilian Kruth (Bedburg, Germany) and Rafal Edward Dunin-Borkowski (Julich, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "The disclosure refers to a magnetization device, and an associated method of operation, for an electron microscope that includes a coil, with a yoke carrying the coil, with a sample holder for holding a sample, and with two poles of the yoke adjo...