US Patent Issued to Fluke on Sept. 1 for "Tester with self-test functions" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,724,101, issued on Sept. 1, was assigned to Fluke Corp. (Everett, Wash.).

"Tester with self-test functions" was invented by Songnan Fan (Shanghai) and Hui Zhao (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "A tester includes self-test functions to test a state of a measurement circuit in the tester. For example, the self-test functions test an electrical state, e.g., electrical properties or connection or disconnection states, of a component of the measurement circuit. The self-test functions also test the signal state of an electrical component in the measurement circuit, which may include signal detection, signal transmittance, or measuremen...