US Patent Issued to Feng Chia University on June 30 for "Defect detection module" (Taiwanese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,539, issued on June 30, was assigned to Feng Chia University (Taichung City, Taiwan).

"Defect detection module" was invented by Yue-Der Lin (Taichung City, Taiwan) and Yin-Sheng Chen (Taichung City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A defect detection module comprises a signal emitting module, a transmitting electrode, a receiving electrode, and a signal processing module. The signal emitting module of the present invention emits a first signal. The first signal passes through the transmitting electrode, a medium and the receiving electrode to generate a second signal. The transmitting electrode, the medium and the receiving elec...