US Patent Issued to FEI on Sept. 29 for "Multipole elements and charged particle microscope systems including the same" (Dutch, American Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,749,646, issued on Sept. 29, was assigned to FEI Co. (Hillsboro, Ore.).

"Multipole elements and charged particle microscope systems including the same" was invented by Alexander Henstra (Utrecht, Netherlands), Galen Gledhill (Portland, Ore.) and Ali Gheidari (Best, Netherlands).

According to the abstract* released by the U.S. Patent & Trademark Office: "Multipole elements and charged particle microscope systems including the same. In an example, an apparatus can include plurality of electrodes including a first shape subset and a second shape subset. Each electrode of the first shape subset includes an electrode active surface with a shape that is different than that of each electro...