US Patent Issued to FEI on Sept. 15 for "Few-shot learning for processing microscopy images" (Dutch, American Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,867, issued on Sept. 15, was assigned to FEI COMPANY (Hillsboro, Ore.).

"Few-shot learning for processing microscopy images" was invented by John Flanagan (Hillsboro, Ore.) and Andrei Novikov (Eindhoven, Netherlands).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed herein are scientific instrument support systems, as well as related methods, computing devices, and computer-readable media. For example, in some embodiments, a scientific instrument support apparatus may include: first logic to receive, from a charged particle microscope, a microscopy image of a sample; second logic to generate a first processed image by processing the microscop...