US Patent Issued to FEI on Oct. 6 for "Pixel elements, particle beam microscopes including the same, and associated methods" (Dutch Inventor)

ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,755,927, issued on Oct. 6, was assigned to FEI Co. (Hillsboro, Ore.).

"Pixel elements, particle beam microscopes including the same, and associated methods" was invented by Gerrit Cornelis van Hoften (Veldhoven, Netherlands).

According to the abstract* released by the U.S. Patent & Trademark Office: "Pixel elements and associated methods are disclosed herein. A pixel element can comprise a radiation-sensitive element configured to generate an electric charge, a floating diffusion node, a charge storage device, and an output stage configured to generate a charge signal. The pixel element is configured to operate in a high-gain mode and a low-gain mode and can have a total dynamic range...