ALEXANDRIA, Va., May 12 -- United States Patent no. 12,626,883, issued on May 12, was assigned to FEI Co. (Hilllsboro, Ore.).
"Apparatus and method for manipulating a microscopic sample" was invented by Joseph M Lebow (Hillsboro, Ore.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A sample manipulation system for a sample to be used in a charged particle beam process. The sample manipulation system includes a carrier defining a passageway, a wire slidably supported and at least partially housed by the carrier, and a feed mechanism. The wire is configured to slide through the passageway. The wire includes a supported portion and a protruding portion. The supported portion is disposed in the passageway and the...