US Patent Issued to FEI on March 17 for "Systems and methods for analyzing a sample using charged particle beams and active pixel control sensors" (Czech Inventors)

ALEXANDRIA, Va., March 17 -- United States Patent no. 12,580,150, issued on March 17, was assigned to FEI Co. (Hillsboro, Ore.).

"Systems and methods for analyzing a sample using charged particle beams and active pixel control sensors" was invented by Branislav Straka (Brno, Czech Republic), Pavel Stejskal (Brno, Czech Republic), Tomas Vystavel (Brno, Czech Republic) and Jakub Holzer (Brno, Czech Republic).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods taught herein utilize a single detector to provide both unidimensional data (e.g., for direct topographical imaging) and multidimensional data (e.g., for crystallographic data) for a sample that is interrogated with a charged particle beam. ...