US Patent Issued to FEI on July 14 for "Methods and systems for tomographic microscopy imaging" (Dutch, Norwegian, American Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,116, issued on July 14, was assigned to FEI Co. (Hillsboro, Ore.).

"Methods and systems for tomographic microscopy imaging" was invented by Andreas Voigt (Eindhoven, Netherlands), Trond Varslot (Vuku, Norway) and Magda Zaoralova (Menlo Park, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention relates to a method for acquiring tomographic images of a sample in a microscopy system, wherein the sample comprises a defined region, and wherein the method comprises determining a location in three-dimensional space of the defined region, wherein the method further comprises capturing an image of at least a part of the sample, and whe...