US Patent Issued to FEI on Aug. 11 for "Particle-induced x-ray emission using light and heavy particle beams" (Oregon Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,469, issued on Aug. 11, was assigned to FEI COMPANY (Hillsboro, Ore.).

"Particle-induced x-ray emission using light and heavy particle beams" was invented by Sean M. Kellogg (Portland, Ore.), Aurelien Philippe Jean Maclou Botman (Hillsboro, Ore.) and Daniel Totonjian (Portland, Ore.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of Particle-Induced X-Ray Emission (PIXE) analysis comprises: (a) delivering a first ion beam from a first ion source and comprising ions having a first composition onto an area of a sample, wherein the kinetic energy of the ions is not greater than 50 kilo-electron-Volts (keV); (b) simultaneously with the deliverin...