US Patent Issued to FEI on April 21 for "Augmentation of electron energy loss spectroscopy in charged particle microscopes" (Dutch Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,577, issued on April 21, was assigned to FEI Co. (Hillsboro, Ore.).

"Augmentation of electron energy loss spectroscopy in charged particle microscopes" was invented by Wouter Rene J. Van den Broek (Utrecht, Netherlands).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and techniques for processing electron energy loss spectrum (EELS) data are described. A method for processing EELS data can include receiving spectrum data. The spectrum data can be structured as an array of EELS spectra associated with a spatial region of a material sample. The method can include generating a reference spectrum using the spectrum data. The method can include ge...