US Patent Issued to FANUC on Sept. 8 for "Machine learning apparatus, control device, machining system, and machine learning method for learning correction amount of workpiece model" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,051, issued on Sept. 8, was assigned to FANUC Corp. (Yamanashi, Japan).

"Machine learning apparatus, control device, machining system, and machine learning method for learning correction amount of workpiece model" was invented by Kenichi Ogawa (Yamanashi, Japan) and Takashi Nagatomi (Yamanashi, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A machine learning apparatus capable of reducing an error between a machined workpiece and a target shape when the workpiece is machined based on a workpiece model modeling the target shape of the workpiece. A machine learning apparatus includes a state observation section configured to observe machining st...