US Patent Issued to FANUC on March 3 for "Three-dimensional measurement device" (Japanese Inventor)

ALEXANDRIA, Va., March 3 -- United States Patent no. 12,566,060, issued on March 3, was assigned to FANUC Corp. (Yamanashi, Japan).

"Three-dimensional measurement device" was invented by Fumikazu Warashina (Yamanashi, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "This three-dimensional measurement device comprises: a projection unit that projects reference light to an object while performing scanning with the light; a light reception unit that receives the reference light reflected on the object; a time extent setting unit that sets a scanning time extent of the reference light in accordance with a distance-measuring range for each prescribed section of the light reception unit; and a three-dimensiona...