US Patent Issued to FANUC on July 7 for "Three-dimensional measurement system" (Japanese Inventor)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,659, issued on July 7, was assigned to FANUC Corp. (Yamanashi, Japan).

"Three-dimensional measurement system" was invented by Wataru Tooyama (Yamanashi, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The three-dimensional measurement system 1 pertaining to a first embodiment of the present disclosure, whereby the three-dimensional shape of a measurement object can be accurately measured regardless of the position of the measurement object, comprises a three-dimensional measurement unit 32 that measures the position and shape of the measurement object using a three-dimensional sensor 20 that measures a distance to the measurement object, a robot...