ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,762, issued on April 14, was assigned to F Time Technology Industrial Co. Ltd. (New Taipei City, Taiwan).
"Test terminal" was invented by Chang-Lin Peng (New Taipei City, Taiwan), Chih-Min Peng (New Taipei City, Taiwan) and Yu-Han Huang (New Taipei City, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A test terminal has a connecting assembly and at least one probe assembly. The connecting assembly has a first connecting unit and a second connecting unit. The first connecting unit has an installation hole and the second connecting unit has a limit space. The probe assembly includes a main sleeve, a connecting sleeve, a probe module, and a buf...