ALEXANDRIA, Va., July 7 -- United States Patent no. 12,675,583, issued on July 7, was assigned to EYGS LLP (London).

"Systems and methods for generating synthetic data for feature-based vulnerability testing" was invented by Lince Lawrence (Trivandrum, India), Venkatabapu Yeluri (Bengaluru, India), Dhanith Krishna B (Trivandrum, India) and Lavanya Wadhwa (Bangalore, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method includes receiving, at a processor, feature data that indicates a plurality of features. The method further includes generating, via the processor and based on the feature data, vulnerability data that indicates a vulnerability associated with the plurality of features. Additionally, t...