US Patent Issued to Etron Technology on April 21 for "Memory with electrically programmable fuses and related tester" (Taiwanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,271, issued on April 21, was assigned to Etron Technology Inc. (Hsinchu, Taiwan).

"Memory with electrically programmable fuses and related tester" was invented by Ho-Yin Chen (Hsinchu County, Taiwan), Po-Hung Yang (Hsinchu City, Taiwan) and Chun-Chia Chen (Yunlin County, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A memory with e-fuses includes a receiving circuit and a plurality of e-fuse groups. Each e-fuse group of the e-fuse groups is coupled to the receiving circuit through a corresponding bus group. The receiving circuit receives a plurality of blown signal sets each time and transmits each of the blown signal sets to a e-fuse group...