US Patent Issued to Essilor International on April 7 for "System and method for determining refraction features of both first and second eyes of a subject" (French Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,593,975, issued on April 7, was assigned to Essilor International (Charenton-le-Pont, France).

"System and method for determining refraction features of both first and second eyes of a subject" was invented by Stephane Boutinon (Charenton-le-Pont, France), Estelle Netter (Charenton-le-Pont, France), Martha Hernandez-Castaneda (Charenton-le-Pont, France), Konogan Baranton (Charenton-le-Pont, France) and Gildas Marin (Charenton-le-Pont, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system for determining refraction features of both first and second eyes of a subject including a light field display device, a system of localization of the position...