US Patent Issued to ESPEC on May 12 for "Environmental test apparatus with bypass flow path with flow rate control portion controlled according to temperature of compressor" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,036, issued on May 12, was assigned to ESPEC CORP. (Osaka, Japan).

"Environmental test apparatus with bypass flow path with flow rate control portion controlled according to temperature of compressor" was invented by Haruki Seto (Osaka, Japan), Yuta Moriyama (Osaka, Japan), Katsuhiko Watabe (Osaka, Japan), Tetsuya Okadome (Osaka, Japan), Masaki Yamamoto (Osaka, Japan) and Takumi Usui (Osaka, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided an environmental test apparatus that can create a predetermined environment inside a test chamber, the environmental test apparatus including: the test chamber for placing a test target object...