ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,459, issued on Sept. 15, was assigned to DONGWOO FINE-CHEM Co. LTD. (Jeollabuk-do, South Korea).
"Particle measurement device" was invented by Young Hoon Kim (Gyeonggi-do, South Korea), Su Yeon Oh (Gyeonggi-do, South Korea), Min Ju Lee (Gyeonggi-do, South Korea) and Seung Pil Han (Jeollabuk-do, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A particle measuring device includes a flow cell unit including a cell hollow portion in which a liquid sample flows, a mount unit including an accommodation hole accommodating at least a portion of the flow cell unit, and a resonance unit positioned behind the mount unit and coupled to the mount uni...