US Patent Issued to Diodes on April 14 for "Calibration device" (Chinese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,604,702, issued on April 14, was assigned to Diodes Inc. (Plano, Texas).

"Calibration device" was invented by WanHui Li (Chengdu, China) and JiaWei Tai (Chengdu, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for calibrating a tray shield used for holding a wafer for processing is provided. The tray shield is in a ring shape. The method includes determining whether a first calibration ring is placeable into an inner chamber of the tray shield. When the first calibration ring is placeable into the inner chamber, the tray shield is determined to be usable for wafer processing. The first calibration ring is moved around inside the inner cha...