US Patent Issued to Denka on March 24 for "Immunoassay method and immunoassay apparatus" (Japanese Inventor)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,584,908, issued on March 24, was assigned to Denka Co. Ltd. (Tokyo).

"Immunoassay method and immunoassay apparatus" was invented by Miwa Kuwahara (Niigata, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a highly-sensitive antibody and a test reagent using the antibody.A method for detecting an analyte according to an immunoassay method, using a carrier on which an antigen, an antibody or an antigen-binding fragment thereof is immobilized, wherein the analyte is detected with increasing detection sensitivity by using a carrier to which an antigen, an antibody or an antigen-binding fragment thereof was immobilized by adding disaccharid...