US Patent Issued to Dell Products on Oct. 20 for "Method for efficiently improving test case coverage and robustness" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,769,639, issued on Oct. 20, was assigned to Dell Products LP (Round Rock, Texas).

"Method for efficiently improving test case coverage and robustness" was invented by Xiaowei Shen (Shanghai), Qin Zhang (Shanghai), Celine Ling Xu (Shanghai) and Jin Qin (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed methods for selecting test cases determine differences between first and second versions of firmware. The first version may correspond to a version currently in use while the second version represent an update to the first version, including one or more bug fixes and/or additional features. Based at least in part on the differences between ...