ALEXANDRIA, Va., May 5 -- United States Patent no. 12,619,738, issued on May 5, was assigned to Dell Products LP (Round Rock, Texas).

"Generating test data" was invented by Rustem Rafikov (Hopkinton, Mass.), Christopher Jones (Plainville, Mass.), Philippe Armangau (Kalispell, Mont.), Sathya Krishna Murthy (Morrisville, N.C.) and Bruce A. Zimmerman (Concord, Mass.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A technique is directed to generating test data to be written in a predefined testing environment. The technique includes receiving an entropy value indicating an amount of entropy of write data of a completed write operation to be mimicked by the test data, and a deduplication value indicating a target...