US Patent Issued to Dell Products on March 3 for "Multi-path layer configured for performing root cause analysis of path anomalies" (Indian, American Inventors)

ALEXANDRIA, Va., March 3 -- United States Patent no. 12,568,040, issued on March 3, was assigned to Dell Products LP (Round Rock, Texas).

"Multi-path layer configured for performing root cause analysis of path anomalies" was invented by Peniel Charles (Bangalore, India), Manikandan Sethuraman (Bangalore, India), Amudha Krishnasamy (Bangalore, India), Venkata Adireddy Padala (Shrewsbury, Mass.) and Vighneshwar Hegde (Bangalore, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus comprises a processing device configured to detect one or more performance anomalies associated with a given path interconnecting a given host device and a storage system, to identify a set of two or more checkpoints cha...