US Patent Issued to Dell Products on June 23 for "Test coverage optimizing mechanism based on metric evaluation system" (Chinese Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,664,076, issued on June 23, was assigned to Dell Products LP (Round Rock, Texas).

"Test coverage optimizing mechanism based on metric evaluation system" was invented by Huijuan Fan (Chengdu, China) and Bob Biao Yan (Chengdu, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, system, and non-transitory processor-readable storage medium for test coverage optimizing system are provided herein. An example method includes executing at least one test case on a system. A weighted average baseline metrics calculation module calculates a weighted average baseline metric for at least one test case using test related failures that occurred during the ex...