ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,740,510, issued on Sept. 22, was assigned to Deere & Co. (Moline, Ill.).
"Overblown grain loss detection" was invented by Nathan R. Vandike (Geneseo, Ill.) and Rana Shakti Singh (Ramgarh, India).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method of operating a grain harvesting machine includes: capturing images of a crop material flow in an image capture area of the grain harvesting machine; identifying a plurality of grain elements in the images; determining a velocity of each of the grain elements; determining whether each of the grain elements is likely to be overblown out of the grain harvesting machine based at least in part on the velocity of...