ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,939, issued on April 14, was assigned to DAIKIN INDUSTRIES LTD. (Osaka, Japan).
"Inspection system and inspection method" was invented by Shogo Kawai (Osaka, Japan), Naomi Yoshimura (Osaka, Japan), Aoi Goto (Osaka, Japan), Wakana Takano (Osaka, Japan), Ryuichiro Oto (Osaka, Japan), Shotaro Maeda (Osaka, Japan), Mirei Kanetake (Osaka, Japan), Takashi Namikawa (Osaka, Japan) and Shiho Watanabe (Osaka, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An sure, an inspection system and an inspection method that reduce the time required to inspect environmental microorganisms, are provided. The inspection system inspection system is for inspecting a ...