US Patent Issued to DAICEL on Oct. 6 for "Abnormal irregularity cause identifying device, abnormal irregularity cause identifying method, and abnormal irregularity cause identifying program" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,754,541, issued on Oct. 6, was assigned to DAICEL Corp. (Osaka, Japan).

"Abnormal irregularity cause identifying device, abnormal irregularity cause identifying method, and abnormal irregularity cause identifying program" was invented by Hiroki Oka (Tokyo), Koichi Yamano (Tokyo) and Hiroharu Matsumoto (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An abnormal irregularity cause identifying device includes a process data acquisition unit that reads process data output by sensors included in a production facility performing a batch stage and a continuous stage, a preprocessing unit that associates a range of a complete timing of the batch stage with...