US Patent Issued to DAEGU GYEONGBUK INSTITUTE OF SCIENCE AND TECHNOLOGY on March 24 for "Material measuring device, material measuring system and material measuring method" (South Korean Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,584,885, issued on March 24, was assigned to DAEGU GYEONGBUK INSTITUTE OF SCIENCE AND TECHNOLOGY (Daegu, South Korea).

"Material measuring device, material measuring system and material measuring method" was invented by Hoe Joon Kim (Seoul, South Korea), Il Ryu Jang (Daegu, South Korea) and Soon In Jung (Daegu, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention relates to a surface acoustic wave-based material measuring device, material measuring system, and material measuring method, and more particularly, to a technique of accurately and reliably measuring various inherent physical properties of temperature and frequency...