US Patent Issued to CONTEMPORARY AMPEREX TECHNOLOGY on May 19 for "Battery defect inspection device, method, and apparatus" (Chinese Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,575, issued on May 19, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY Co. Ltd. (Ningde City, China).

"Battery defect inspection device, method, and apparatus" was invented by Hao Lin (Ningde, China), Jianlin Liu (Ningde, China), Fenglin Zhang (Ningde, China) and Xiaofeng Zhou (Ningde, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A battery defect inspection device, method, and apparatus are disclosed. The battery defect inspection device includes a ray source, a detector, and a supporting component between the ray source and the detector. A battery under inspection is configured to be located on a supporting surface of the supporting componen...