US Patent Issued to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) on Nov. 3 for "Inspection circuit and method" (Chinese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,460, issued on Nov. 3, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) Ltd. (Hong Kong).

"Inspection circuit and method" was invented by Haijie Wang (Ningde, China), Xueqing Gong (Ningde, China), Guangwei Zhou (Ningde, China), Jiawu Cheng (Ningde, China) and Jiacai Wang (Ningde, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection circuit includes a plurality of inspection devices and a plurality of pathway switching circuits. Input ends of the pathway switching circuits are respectively connected to different test lines. The test lines are connected to a test terminal corresponding to a battery cell under test. Output ends ...