US Patent Issued to Commissariat a l'Energie Atomique et aux Energies Alternatives on June 30 for "System for measuring an estimated degree of linear polarization of an electromagnetic radiation reflected by a scene" (French Inventor)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,377, issued on June 30, was assigned to Commissariat a l'Energie Atomique et aux Energies Alternatives (Paris).

"System for measuring an estimated degree of linear polarization of an electromagnetic radiation reflected by a scene" was invented by Francois Deneuville (Grenoble, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system for determining an estimated degree of polarization of a radiation reflected) by a scene, including a first light source of a first electromagnetic radiation at a first frequency and rectilinearly polarized according to a first direction, a second light source of a second electromagnetic radiation at a second frequ...